JIMING BIAN; SHUKUO ZHAO; LIHUA MIAO; HONGZHU LIU; FUWEN QIN; DONG ZHANG; JINGCHANG SUN. In-Situ AlN Induced Valence State Variation of V in Vanadium Oxide Films Investigated by XPS. Journal of Material Science and Technology Research, [S. l.], v. 1, n. 1, p. 15–21, 2014. DOI: 10.15377/2410-4701.2014.01.01.3. Disponível em: https://zealpress.com/jms/index.php/jmstr/article/view/49. Acesso em: 22 dec. 2024.